Scanning Microscopy for Nanotechnology

Scanning Microscopy for Nanotechnology

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Scanning electron microscopy (SEM) can be integrated with technologies for in-situ nanomaterials engineering and manipulation. This book addresses the development of these techniques for nanotechnology. It covers such topics as nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, and various other techniques.Scanning electron microscopy (SEM) can be integrated with technologies for in-situ nanomaterials engineering and manipulation. This book addresses the development of these techniques for nanotechnology.


Title:Scanning Microscopy for Nanotechnology
Author: Weilie Zhou, Zhong Lin Wang
Publisher:Springer Science & Business Media - 2007-03-09
ISBN-13:

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